UH110-UFD1 is implemented with LDPC(Low Density Parity Check)ECC engine to extend SSD endurance & increase data reliability while reading raw data inside a flash chip
- Adopts advanced LDPC ECC engine with 3D NAND SLC-liteX technology to improve reliability
- Global Wear Leveling
- Flash bad-block management
- 4K Page Mapping
- Power Failure Management
- S.M.A.R.T.
- Hyper Cache Technology
- SMART Read Refresh™
Interface USB 3.2 Gen1
Connector USB Type A Plug
Form Factor USB flash drive
NAND Flash Type 3D TLC
Capacity 32GB~64GB
External DRAM No
Sequential Read Performance (MB/sec) Up to 270
Sequential Write Performance (MB/sec) Up to 140
ECC Engine Low-Density Parity-Check (LDPC) Code
IOPS (4K Random Write) 900
Standard Operating Temperature ( °C ) 0 ~ + 70
Extended Operating Temperature ( °C ) -40 ~ + 85
*Not supported on 16GB
Storage Temperature ( °C ) -55 ~ + 100
Housing Yes
H/W Write Protect No
Shock Operation: 50G/11ms (compliant with MIL-STD-202G)
Non-operation: 1500G/0.5ms (compliant with MIL-STD-883K)
Vibration Operation: 7.69 Grms, 20~2000 Hz/random (compliant with MIL-STD-810G)
Non-operation: 4.02 Grms, 15~2000 Hz/random (compliant with MIL-STD-810G)
Operating Voltage 5.0 V ± 5%
Power Consumption Active mode: 200 mA; Idle mode: 85 mA
Dimension (L x W x H ) 46.85 mm x 17.2 mm x 7.7 mm
MTBF (hours) >3,000,000
Technology Bidirectional Security Identification / Page Mapping / SLC-liteX / S.M.A.R.T. / Smart Read Refresh™ / Thermal Cycling / Wide Temperature
Application Defense / Gaming / Healthcare / Server & Networking